R&D Manager Identity & Security – Agfa-Gevaert
Speaks at ID WORLD on Secure Identification
Ph.D. in science/chemistry 1993, university of Antwerp, summa cum laude. Postdoctoral research at the University of Antwerp in cooperation with different research centra and industry. Started at Agfa in 1994 as project leader in the analytical research department. After 4 years project leader in R&D for the development of materials for the medical industry. 2 years later, project manager in R&D for the development of systems in mammography, responsible for different projects and development of new materials. Since 2006 R&D manager in the identity and security department, responsible for developing new materials for identity cards. Since 2010 business manager and R&D manager for the development of new materials in card industry. Owner of more than 100 publications in the analytical chemistry field and several inventions in chemistry and material science are patented.
“First results from the next generation of ID card durability tests”
Smart card durability tests according to ISO 7810 are dated back to the stone age of card manufacturing. The tests have been and still are a major asset in QS activities. However, for serious investigations on life expectations of ID Cards they cannot be deployed realistically.
Major efforts are taking place in ISO / IEC working group ISO / ICE 24789 to take card lifetime simulation to a new level. The new norm combines experiences from major industry players and develops test scenarios on a 2-dimensional model of usage and ageing.
The presentation will provide a brief overview on the current status and it will present first results of the new test scenarios applied to a variety of card materials.
It will allow to reflect on the findings based on the new evaluation methods and will give an insight into the real performance of the major material groups used in the ID industry today.